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The CPM particulate
monitors operate on the principle of scintillation, the most reliable,
accurate and advanced monitoring method available today, as is explained
in the "How it works"
section of this website. There are other available monitoring technologies,
all of which have serious shortcomings. |
Triboelectric/Probe devices
Impact device
The probe sticks directly into the stack, and a triboelectric charge
is passed to a receiving unit when dust particles pass by.
- AC-sheath wave
This new generation of tribo-type devices really does not use the triboelectric
effect for their method of measurement. They are creating an electrical
circuit, which uses the probe, the gas in the duct and the insulating
layer on the probe in the circuit. The circuit is then energized and
the sensitivity of the device adjusted to provide indication of the
particulate passing within proximity of the probe. The sensitivity adjustment
determines how closely the particles must come to be detected. The presence
of particulate in the gas stream causes a disturbance in the electrical
circuit, which the electronics interpret and correlate to an emissions
level.
There are several problems associated with this type of monitoring device.
- Charged particles
If a particle holding a charge passed the probe, the static discharge
causes a high false reading.
- Susceptible to electrical noise
Due to the fact that the signal caused by particles passing within the
area of the probe are very small, electrical noise or static charge
on the particles can cause erroneous readings. In addition, the sensitivity
adjustment is left up to the user to determine what is the correct setting.
- Particulate buildup does affect control
response
The fact that the probe and the gas stream are part of the detection
circuit, if the insulating characteristics of the probe are changed
(particulate builds up on the probe), then the probe's ability to detect
will be affected. A change in the sensitivity will be required, which
changes the correlation of the system.
- Probe abrasion
In high velocity zones, the probe can be eroded away. In the old design
the probe was passive and relied on direct contact with the particles.
The newer designs utilize an insulating sleeve on the probe and the
probe is energized. If the sleeve is abraded away, an energized probe
would then be exposed.
- Does not provide adequate duct coverage
The standard length for these probes is 1-2 feet, which in most cases
does not span the entire duct diameter. By not spanning the duct, the
device is counting on laminar gas flow, which does not occur in a high
majority of the collectors installed today.
Opacity monitors
Opacity
monitors are really transmissometers that report the data in terms of
opacity. Transmissometers measure the transmission of light through a
medium such as dust or smoke. Opacity monitors report the opacity or optical
density of the smoke. The relationship between transmission and opacity
follows:
| |
% Transmission (light through the smoke) |
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+ |
% Opacity (light blocked by the smoke)
|
|
| |
100% |
Opacity monitors mount on a stack or duct and project a beam of light
from an optical head on one side to a reflector on the other. The light
is reflected back through the gas (double pass for greater sensitivity)
to the optical head. A detector in the optical head determines opacity
by comparing the ratio of the energy level of the reflected light to the
energy level of the projected light.
- The greatest shortfall of opacity monitors is that they are not accurate
below dust levels of 20 mg. Unfortunately most particulate measured
in stacks today is much smaller, making the opacity monitor an unusable
device for monitoring.
- In addition, dust buildup on the lenses can read to false high readings,
thereby slanting the results received.
Backscatter devices
Backscatter
devices are optical devices utilizing a reliable solid-state light source.
The emitted beam passes through a sampling volume, optically defined and
external to the instrument probe, where particulate matter causes incident
light scattering. Backscattered light is then focused onto a detector
and converted into an electrical output. The instrument output is proportional
to the mass concentration over a wide range of particle types and sizes.
A second (reference) detector receives a portion of the emitted light
beam, and is used in a ratio circuit to automatically compensate for any
changes in emitted power.
- The problem with backscatter devices is that they only span across
a small part of the duct.
- Consequently, they assume uniform particulate flow and uniform reflectivity
of particles, a scenario not realistically encountered in operational
conditions.
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